6/9/10, Seminars given
Two Synergy Technologies Engineers were involved with team seminars given at the 2010 IAAI (International Association of Arson Investigators) June Conference in Steven's Point, WI. Rick Korinek, P.E. taught part of a seminar on Electrical Fires with two other Engineers. Chris Korinek, P.E. taught part of a seminar on Mechanical Fires, including reporting on recent in-house testing on wood stove chimneys in contact with cellulose insulation, with one other Engineer.
7/5/09, New article published
The Electrical Construction and Maintenance Magazine (EC&M) has published an article by Chris Korinek, P.E. titled "The Basics of Electrical Overheating" in the June 2009 edition. This article increases dialoge with Electricians and Maintenance personnel who may not see how electricity causes fires very often. Making our homes and workplaces safer is one of the goals of Synergy Technologies and this article.
5/19/09, Engineering Assistant joins Synergy Technologies:
Joshua Oakes has accepted the position of Engineering Assistant/ Product Designer at Synergy Technologies. Joshua will be assisting with visual communications, lab, field, office, and marketing efforts. Joshua has earned a Bachelors Degree in Industrial Design from Milwaukee Institute of Art and Design in December 2008.
12/20/08, Synergy Technologies add SEM/EDS capabilities:
Our new Scanning Electron Microscope (SEM), a Hitachi S3700N, was installed recently and gives us the in-house capability to perform advanced imaging. This unit also features Energy Dispersive Spectroscopy (EDS) which allows us to perform elemental material analysis. Some of the advantages of this unit include: an extra large chamber which will accept a sample up to 12 inches long, the abiltiy to image and analyze non-conductive samples without a sputtered coating, and a motorized and computerized platten. This minimizes the sample destruction, sample preparation time, and imaging and analysis time while allowing the accurate return to a previous point. The unit maximizes the amount of materials able to be imaged and analyzed.